Search
× Search

Webinars

Deep Level Transient Spectroscopy (DLTS) with Boonton 7200 Capacity Meter Webinar
SuperUser Account
/ Categories: Webinars

Deep Level Transient Spectroscopy (DLTS) with Boonton 7200 Capacity Meter Webinar

Broadcasted on 2/16/2011

Presented by:
Wolfgang Damm, Wireless Telecom Group

 

Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects in semiconductors. DLTS allows researchers to define defect parameters and measure the concentration of those defects in space charge region of simple electronic devices, typically Schottky diodes or p-n junctions. DLTS has a higher sensitivity than almost any other semiconductor diagnostic technique available.


 

Previous Article Amplifier Test Part 1 - Replacing Your Crystal/Diode Detector
Next Article Power Measurements of Complex Pulse Trains Webinar
Print
655

Connect

25 Eastmans Road
Parsippany, NJ 07054
United States
Phone: +1 (973) 386-9696
Fax: +1 (973) 386-9191
Email:
info@boonton.com

Contact Us

Terms Of Use
Privacy Policy
Copyright 2020 by Wireless Telecom Group, Inc.
Back To Top