Boonton’s 4540 Series RF Power / Voltage meters provides highly detailed waveform traces for accurate measurements, efficient alignment and detailed analysis of linear and pulsed RF components and circuitry.

Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects in semiconductors. DLTS allows researchers to define defect parameters and measure the concentration of those defects in space charge region of simple electronic devices, typically Schottky diodes or p-n junctions.